Summer School : Combined Analysis Using Ray Scattering
30 juin-4 juil. 2025
ENSICAEN - 6 Bd Maréchal Juin - 14000 Caen - CAEN (France)
This international school covers many aspects of the “Combined Analysis” methodology using X-Ray, neutron and electron scattering, and X-ray fluorescence applied to material science. Fundamental to technical aspects relevant to industrial and academic applications are targeted.
The aim is to give students, academic and non-academic researchers the necessary tools to be able to characterize their own samples using the Combined Analysis method and the software MAUD. The characterization involves obtaining information on the structure, microstructure, phase and elemental content, texture, stress in different kind of samples and structures including : thin films, bulk materials, anisotropic materials, poly-phased materials, nano-materials, etc.
Topics: Diffraction techniques overview, Crystallographic Texture Analysis, Residual Stress Analysis, Rietveld analysis, Reflectivity analysis, Phase analysis, Line broadening analysis, XRD & XRF combined analysis
Discipline scientifique :
Cristallographie - Chimie inorganique - Matériaux
Lieu de la conférence